¼¼°èÀÇ GAAFET Å×Å©³î·¯Áö ½ÃÀå
GAAFET Technology
»óǰÄÚµå : 1758849
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¹ßÇàÀÏ : 2025³â 06¿ù
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GAAFET Å×Å©³î·¯Áö ¼¼°è ½ÃÀåÀº 2030³â±îÁö 3¾ï 2,750¸¸ ´Þ·¯¿¡ À̸¦ Àü¸Á

2024³â¿¡ 7,300¸¸ ´Þ·¯·Î ÃßÁ¤µÇ´Â GAAFET Å×Å©³î·¯Áö ¼¼°è ½ÃÀåÀº 2030³â¿¡´Â 3¾ï 2,750¸¸ ´Þ·¯¿¡ À̸£°í, ºÐ¼® ±â°£ÀÎ 2024-2030³â CAGRÀº 28.4%¸¦ º¸ÀÏ °ÍÀ¸·Î ¿¹ÃøµË´Ï´Ù. ÀÌ º¸°í¼­¿¡¼­ ºÐ¼®ÇÑ ºÎ¹® Áß ÇϳªÀÎ ³ª³ë¿ÍÀ̾î´Â CAGR 27.6%¸¦ ³ªÅ¸³»°í, ºÐ¼® ±â°£ Á¾·á½Ã¿¡´Â 1¾ï 1,830¸¸ ´Þ·¯¿¡ À̸¦ °ÍÀ¸·Î ¿¹ÃøµË´Ï´Ù. ³ª³ë½ÃÆ® ºÎ¹®ÀÇ ¼ºÀå·üÀº ºÐ¼® ±â°£¿¡ CAGR 30.6%·Î ÃßÁ¤µË´Ï´Ù.

¹Ì±¹ ½ÃÀåÀº 1,920¸¸ ´Þ·¯·Î ÃßÁ¤, Áß±¹Àº CAGR27.0%·Î ¼ºÀå ¿¹Ãø

¹Ì±¹ÀÇ GAAFET Å×Å©³î·¯Áö ½ÃÀåÀº 2024³â¿¡´Â 1,920¸¸ ´Þ·¯·Î ÃßÁ¤µË´Ï´Ù. ¼¼°è 2À§ °æÁ¦´ë±¹ÀÎ Áß±¹Àº 2030³â±îÁö 4,960¸¸ ´Þ·¯ ±Ô¸ð¿¡ À̸¦ °ÍÀ¸·Î ¿¹ÃøµÇ¸ç, ºÐ¼® ±â°£ÀÎ 2024-2030³â CAGRÀº 27.0%·Î ÃßÁ¤µË´Ï´Ù. ±âŸ ÁÖ¸ñÇØ¾ß ÇÒ Áö¿ªº° ½ÃÀåÀ¸·Î¼­´Â ÀϺ»°ú ij³ª´Ù°¡ ÀÖÀ¸¸ç, ºÐ¼® ±â°£Áß CAGRÀº °¢°¢ 25.8%¿Í 24.7%¸¦ º¸ÀÏ °ÍÀ¸·Î ¿¹ÃøµË´Ï´Ù. À¯·´¿¡¼­´Â µ¶ÀÏÀÌ CAGR ¾à 19.8%¸¦ º¸ÀÏ Àü¸ÁÀÔ´Ï´Ù.

¼¼°èÀÇ GAAFET Å×Å©³î·¯Áö ½ÃÀå - ÁÖ¿ä µ¿Çâ°ú ÃËÁø¿äÀÎ Á¤¸®

GAAFET ±â¼úÀÌ ¹ÝµµÃ¼ Çõ½ÅÀÇ »õ·Î¿î ½Ã´ë¸¦ ¿©´Â ÀÌÀ¯´Â ¹«¾ùÀϱî?

°ÔÀÌÆ® ÁÖº¯ Àü°è È¿°ú Æ®·£Áö½ºÅÍ(GAAFET) ±â¼úÀº ¹ÝµµÃ¼ ¾ÆÅ°ÅØÃ³ÀÇ Çõ½ÅÀûÀÎ ¹ßÀüÀ¸·Î, FinFET(Fin Field-Effect Transistor) ±¸Á¶¿¡¼­ º¸´Ù È®Àå °¡´ÉÇϰí Àü·Â È¿À²ÀÌ ³ôÀ¸¸ç ¼º´É¿¡ ÃÖÀûÈ­µÈ Æ®·£Áö½ºÅÍ ¼³°è·ÎÀÇ Áß¿äÇÑ ÁøÈ­¸¦ ÀǹÌÇÕ´Ï´Ù. ÀǹÌÇÕ´Ï´Ù. ¹ÝµµÃ¼ ³ëµå°¡ 5nm¸¦ ³Ñ¾î 3nm ¹× 2nm ¿µ¿ªÀ¸·Î Ãà¼ÒµÊ¿¡ µû¶ó ±âÁ¸ FinFET ¼³°è´Â ´Üä³Î È¿°ú, ´©¼³ Àü·ù ¹× Á¤Àü±â ¹«°á¼º Á¦¾î¿¡ ÀÖ¾î Å« ÇѰ迡 Á÷¸éÇϰí ÀÖÀ¸¸ç, GAAFETÀº Æ®·£Áö½ºÅÍ Ã¤³ÎÀ» °ÔÀÌÆ®·Î ¿ÏÀüÈ÷ µÑ·¯½Î´Â ¹æ½ÄÀ¸·Î ÀÌ·¯ÇÑ ¹®Á¦¸¦ ±Øº¹ÇÕ´Ï´Ù. Àü·ùÀÇ È帧À» º¸´Ù Á¤¹ÐÇÏ°Ô Á¦¾îÇϰí, º¸´Ù ¾ö°ÝÇÑ ½ºÀ§Äª Ư¼ºÀ» °¡´ÉÇÏ°Ô ÇÕ´Ï´Ù. ÀÌ·¯ÇÑ Çâ»óµÈ Á¤Àü±â Á¦¾î´Â Àü·Â ¼Òºñ¸¦ Å©°Ô ÁÙÀÌ°í ±¸µ¿ Àü·ù¸¦ °³¼±ÇÏ¿© GAAFETÀº °í±Þ ÄÄÇ»ÆÃ, ¸ð¹ÙÀÏ ÇÁ·Î¼¼¼­, ÀΰøÁö´É(AI) ¿öÅ©·Îµå¿¡¼­ °í¼º´É ¹× ÀúÀü·Â ¿ëµµ¿¡ ÀûÇÕÇÕ´Ï´Ù. ½ÃÆ® ¹× ³ª³ë¿ÍÀ̾î¿Í °°Àº GAAFET ±¸Á¶´Â ä³Î ÆøÀ» º¯°æÇÏ¿© ´Ù¾çÇÑ ¼º´É ¸ñÇ¥¿¡ ¸Â°Ô Á¤¹ÐÇÏ°Ô Á¶Á¤ÇÒ ¼ö ÀÖ½À´Ï´Ù. »ï¼º, ÀÎÅÚ, TSMC µî ÁÖ¿ä ¹ÝµµÃ¼ ¾÷üµéÀº GAAFETÀÇ °³¹ß°ú Â÷¼¼´ë Ĩ ¼³°è¿¡ÀÇ ÅëÇÕ¿¡ Àû±ØÀûÀ¸·Î ÅõÀÚÇϰí ÀÖ½À´Ï´Ù. ¹«¾îÀÇ ¹ýÄ¢ÀÌ ´À·ÁÁö°í Æ®·£Áö½ºÅÍÀÇ ½ºÄÉÀϸµÀÌ ´õ¿í º¹ÀâÇØÁü¿¡ µû¶ó GAAFET ±â¼úÀº ¹Ì·¡ Ĩ ¼º´ÉÀÇ ÇÙ½ÉÀ¸·Î ºÎ»óÇϰí ÀÖÀ¸¸ç, µ¥ÀÌÅÍ Áß½ÉÀÇ ¼¼°è¿¡¼­ Áö¼ÓÀûÀÎ Çõ½ÅÀ» °¡´ÉÇÏ°Ô Çϰí ÀÖ½À´Ï´Ù.

ÃÖÁ¾ ¿ëµµ´Â GAAFET ±â¼úÀÇ Ã¤Åðú ¸ÂÃãÈ­¸¦ ¾î¶»°Ô ÃËÁøÇϰí Àִ°¡?

GAAFET ±â¼úÀÇ Ã¤ÅÃÀº ¼º´ÉÀÌ Áß¿äÇϰí Àü·Â ¼Òºñ¿¡ ¹Î°¨ÇÑ ÃÖÁ¾ ¿ëµµ¿¡ ±¤¹üÀ§ÇÏ°Ô Àû¿ëµÉ ¼ö Àֱ⠶§¹®¿¡ ºü¸£°Ô °¡¼ÓÈ­µÇ°í ÀÖ½À´Ï´Ù. ¼ÒºñÀÚ °¡Àü ºÐ¾ß¿¡¼­´Â Â÷¼¼´ë ½º¸¶Æ®Æù, ³ëÆ®ºÏ, ¿þ¾î·¯ºí ±â±â¿¡¼­ ¹èÅ͸® ¼ö¸íÀ» Àý¾àÇϸ鼭 °í¼Ó ÄÄÇ»ÆÃÀ» ±¸ÇöÇÒ ¼ö Àִ Ĩ¼ÂÀÌ ¿ä±¸µÇ°í ÀÖ½À´Ï´Ù. ¾öû³­ º´·Ä ó¸®¿Í ºü¸¥ µ¥ÀÌÅÍ Ã³¸®·®À» ¿ä±¸ÇÏ´Â AI ¹× ¸Ó½Å·¯´×(ML) ¿öÅ©·Îµå¿¡¼­ GAAFET ±â¹Ý ·ÎÁ÷Àº ½Ç½Ã°£ Ãß·Ð ¹× ¸ðµ¨ ÈÆ·Ã¿¡ ÇʼöÀûÀÎ ³ôÀº Æ®·£Áö½ºÅÍ ¹Ðµµ¿Í ³·Àº ·¹ÀÌÅϽø¦ °¡´ÉÇÏ°Ô ÇÕ´Ï´Ù. ¿ÍÆ®´ç ¼º´ÉÀÌ Áß¿äÇÑ µ¥ÀÌÅͼ¾ÅÍ¿¡¼­ GAAFETÀº ¿î¿µ ºñ¿ë°ú ź¼Ò ¹ßÀÚ±¹À» ºñ·ÊÀûÀ¸·Î Áõ°¡½ÃŰÁö ¾ÊÀ¸¸é¼­ Ŭ¶ó¿ìµå ÄÄÇ»ÆÃÀÇ ¼ºÀåÀ» À¯ÁöÇÏ´Â µ¥ ÇÊ¿äÇÑ ¿¡³ÊÁö¸¦ Àý¾àÇÒ ¼ö ÀÖ½À´Ï´Ù. ÀÚµ¿Â÷ ÀüÀå, ƯÈ÷ ÀÚÀ²ÁÖÇàÂ÷ ¹× ÷´Ü¿îÀüÀÚº¸Á¶½Ã½ºÅÛ(ADAS)µµ º¹ÀâÇÑ Â÷·® ³» ÀÇ»ç°áÁ¤ ½Ã½ºÅÛÀ» Áö¿øÇÏ´Â GAAFETÀÇ ½Å·Ú¼º°ú °íÁÖÆÄ µ¿ÀÛÀÇ ÀÌÁ¡À» ´©¸± ¼ö ÀÖ½À´Ï´Ù. ¶ÇÇÑ, »ç¹°ÀÎÅͳÝ(IoT) ¹× ¿§Áö ÄÄÇ»ÆÃ ȯ°æ¿¡¼­´Â µð¹ÙÀ̽º°¡ ÃÖ¼ÒÇÑÀÇ ¿¡³ÊÁö ¼Òºñ¿Í ÄÄÇ»ÆÃ ¹Îø¼ºÀÇ ±ÕÇüÀ» À¯ÁöÇØ¾ß Çϴµ¥, GAAFETÀº ÃʼÒÇü, °íÈ¿À² SoC(System on Chip)¸¦ °¡´ÉÇÏ°Ô ÇÕ´Ï´Ù. ¿ëµµÀÇ ´Ù¾ç¼º°ú ¿ä±¸»çÇ×ÀÌ Áõ°¡ÇÔ¿¡ µû¶ó GAAFETÀº ÃÊÀúÀü·Â ¼¾¼­¿¡¼­ ÇÏÀÌ¿£µå ÇÁ·Î¼¼¼­¿¡ À̸£±â±îÁö ´Ù¾çÇÑ ¼º´É °èÃþÀ» Áö¿øÇÏ´Â µ¥ ÇÊ¿äÇÑ È®À强°ú ±¸¼º °¡´É¼ºÀ» Á¦°øÇÏ¿© »õ·Î¿î µð¹ÙÀ̽º ÀÎÅÚ¸®Àü½º ¹× ÅëÇÕÀÇ ½Ã´ë¸¦ ¿­¾î°¡°í ÀÖ½À´Ï´Ù.

GAAFET ¾ÆÅ°ÅØÃ³ÀÇ °³¹ß ¹× ÅëÇÕÀ» Áö¿øÇÏ´Â ±â¼ú Çõ½ÅÀº ¹«¾ùÀΰ¡?

GAAFET ±â¼úÀÇ ±¸ÇöÀº Àç·á°øÇÐ, ¸®¼Ò±×·¡ÇÇ ¹× ¼ÒÀÚ Á¦Á¶ ±â¼úÀÇ Çõ½ÅÀÇ ¹°°á¿¡ ÀÇÇØ ÃßÁøµÇ°í ÀÖ½À´Ï´Ù. GAAFETÀÇ Æ¯Â¡ Áß Çϳª´Â ÀûÃþµÈ ³ª³ë½ÃÆ® ¶Ç´Â ³ª³ë¿ÍÀ̾ »ç¿ëÇÏ¿© ÁõÂø ¹× ¿¡Äª °øÁ¤¿¡¼­ ¿øÀÚ ´ÜÀ§ÀÇ Á¤¹Ðµµ°¡ ¿ä±¸µÇ´Â ³ª³ë ½ºÄÉÀÏ Æ®·£Áö½ºÅÍ ¼³°èÀÇ °úÁ¦¸¦ ±Øº¹ÇÏ´Â µ¥ ÇʼöÀûÀÎ ¿ä¼ÒÀÔ´Ï´Ù. ÷´Ü ±ØÀڿܼ±(EUV) ¸®¼Ò±×·¡ÇÇ´Â ÀÌ·¯ÇÑ ±¸Á¶¸¦ ¼­ºê³ª³ë¹ÌÅÍ ¼öÁØÀÇ Á¤¹Ðµµ·Î ÆÐÅÍ´×ÇÏ´Â µ¥ ¸Å¿ì Áß¿äÇÑ ¿ªÇÒÀ» Çϸç, Á¦Á¶¾÷ü°¡ 3nm ÀÌÇÏÀÇ ³ëµå¿¡¼­µµ ³ôÀº ¼öÀ²À» ´Þ¼ºÇÒ ¼ö ÀÖ°Ô ÇØÁÝ´Ï´Ù. ¿øÀÚÃþ ÁõÂø¹ý(ALD)°ú ¼±ÅÃÀû ¿¡Äª ±â¼úµµ GAAFETÀÇ ¼º´ÉÀ» °áÁ¤ÇÏ´Â ÃʹÚÇü ä³Î°ú ÄÁÆ÷¸Ö °ÔÀÌÆ® ±¸Á¶ÀÇ Çü¼º¿¡ ÇʼöÀûÀ̸ç, high-k À¯Àüü, ½Ç¸®ÄÜ-°Ô¸£¸¶´½(SiGe), »õ·Î¿î ±Ý¼Ó °ÔÀÌÆ® ½ºÅðú °°Àº Àç·á´Â À̵¿µµ¸¦ ³ôÀÌ°í ±â»ý ¿ë·®À» ÁÙÀ̸ç Àå½Ã°£ »ç¿ë¿¡ °ßµô ¼ö ÀÖ´Â ½Å·Ú¼ºÀ» À¯ÁöÇϵµ·Ï ÃÖÀûÈ­µÇ¾î ÀÖ½À´Ï´Ù. Ĩ·¿ ¾ÆÅ°ÅØÃ³ ¹× ½Ç¸®ÄÜ °üÅë Àü±Ø(TSV)À» Æ÷ÇÔÇÑ 3D ÁýÀû ±â¼úÀº ½Ã½ºÅÛ ·¹º§ ÆÐŰÁö¿¡¼­ GAAFET ±â¹Ý ¼³°è¸¦ º¸¿ÏÇϱâ À§ÇØ °øµ¿ °³¹ßµÇ°í ÀÖ½À´Ï´Ù. ¶ÇÇÑ, °è»ê ¸ðµ¨¸µ, AI Áö¿ø ¼³°è ÀÚµ¿È­, ÀüÀÚ ¼³°è ÀÚµ¿È­(EDA) ÅøÀ» ÅëÇØ ´Ù¾çÇÑ Àü±âÀû ¹× ¿­Àû Á¶°Ç¿¡¼­ GAAFET Æ®·£Áö½ºÅÍÀÇ Á¤¹ÐÇÑ ½Ã¹Ä·¹ÀÌ¼Ç ¹× ·¹À̾ƿôÀ» °¡´ÉÇÏ°Ô Çϰí ÀÖÀ¸¸ç, III-VÁ· ¹ÝµµÃ¼ ¹× ±×·¡ÇÉ, MoS2¿Í °°Àº 2D Àç·áµµ Æ÷ÇÔÇÕ´Ï´Ù. »õ·Î¿î ä³Î Àç·á¿¡ ´ëÇÑ ¿¬±¸´Â GAAFETÀÇ ÇâÈÄ ±â´É È®ÀåÀ» ½Ã»çÇϰí ÀÖ½À´Ï´Ù. ÀÌ·¯ÇÑ ±â¼úÀ» ÅëÇØ GAAFETÀº 3nm ÀÌÇÏ ³ëµå¿¡¼­ ½ÇÇöµÉ ¼ö ÀÖÀ» »Ó¸¸ ¾Æ´Ï¶ó, Ĩ Á¦Á¶ÀÇ ¿Â½ºÆ®·Ò ½Ã´ë¸¦ ÇâÇØ Àå±âÀûÀ¸·Î ÁøÈ­ÇÒ Áغñ°¡ µÇ¾î ÀÖ½À´Ï´Ù.

GAAFET ±â¼úÀÇ ¼¼°è º¸±ÞÀ» ÃËÁøÇÏ´Â ½ÃÀå ¿ªÇÐÀº ¹«¾ùÀΰ¡?

GAAFET ±â¼ú ½ÃÀåÀÇ ¼ºÀåÀº FinFET¿¡¼­ º¸´Ù Áøº¸µÈ Æ®·£Áö½ºÅÍ ¾ÆÅ°ÅØÃ³·ÎÀÇ ÀüȯÀ» ÃËÁøÇÏ´Â ½ÃÀå ¾Ð·Â, ÁöÁ¤ÇÐÀû º¯È­, ¾÷°è ·Îµå¸Ê, °æÀï ¿ªÇÐÀÇ °áÇÕ¿¡ ÀÇÇØ ÃËÁøµÇ°í ÀÖ½À´Ï´Ù. °¡Àå Å« ¿øµ¿·Â Áß Çϳª´Â ±âÁ¸ ¹æ¹ýÀ¸·Î´Â Æ®·£Áö½ºÅÍ ¼ö¿Í Àü·Â È¿À²À» °³¼±Çϱ⠾î·Á¿î Æ÷½ºÆ® ¹«¾îÀÇ ¹ýÄ¢ ½Ã´ë¿¡ ¹ÝµµÃ¼ ¾÷°è°¡ Áö¼ÓÀûÀ¸·Î ¼º´ÉÀ» ¹Ì¼¼È­ÇØ¾ß ÇÑ´Ù´Â Á¡À̸ç, GAAFETÀÇ ¶Ù¾î³­ È®À强°ú ¿¡³ÊÁö È¿À²Àº ÀÌ·¯ÇÑ ¸ñÇ¥¿¡ ¿Ïº®ÇÏ°Ô ºÎÇÕÇÕ´Ï´Ù. ½Ç¸®ÄÜ ÁøÈ­ÀÇ ´ÙÀ½ ´Ü°è°¡ µÉ ¼ö ÀÖ½À´Ï´Ù. Ĩ Á¦Á¶¾÷üµéÀÌ ´õ ÀÛ°í, ´õ ºü¸£°í, ´õ Àü·Â ¼Ò¸ð°¡ ÀûÀº ĨÀ» Á¦°øÇØ¾ß ÇÑ´Ù´Â ¾Ð¹Ú¿¡ Á÷¸éÇÑ °¡¿îµ¥, GAAFETÀº ÃÖ÷´Ü ³ëµåÀÇ ¿ä±¸»çÇ×À» ÃæÁ·ÇÏ´Â Àû½Ã¼º ÀÖ´Â ¼Ö·ç¼ÇÀ» Á¦°øÇÕ´Ï´Ù. ÇÑÆí, °ø±Þ¸Á È¥¶õ°ú ÁöÁ¤ÇÐÀû ±äÀåÀ¸·Î ÀÎÇØ ¾ÇÈ­µÇ°í ÀÖ´Â ±â¼ú ÁÖ±ÇÀ» È®º¸ÇÏ·Á´Â ¼¼°èÀûÀÎ ¿òÁ÷ÀÓÀº ±¹°¡¿Í ±â¾÷µéÀÌ ±¹³» ¹ÝµµÃ¼ ¿¬±¸°³¹ß ¹× ÁÖÁ¶ ´É·Â¿¡ ´ëÇÑ ¸·´ëÇÑ ÅõÀÚ¸¦ À¯µµÇϰí ÀÖÀ¸¸ç, GAAFETÀº ÀÌ·¯ÇÑ Â÷¼¼´ë ÆÕÀÇ Á߽ɿ¡ À§Ä¡ÇÏ´Â °æ¿ì°¡ ¸¹½À´Ï´Ù. ÀÎÅÚ, »ï¼º, TSMC¿Í °°Àº ¹ÝµµÃ¼ ´ë±â¾÷ °£ÀÇ °æÀï °ü°èµµ GAAFET ±â¹Ý »ó¿ë ĨÀ» °¡Àå ¸ÕÀú ½ÃÀå¿¡ Ãâ½ÃÇÏ¿© ±â¼úÀû ¿ìÀ§¸¦ È®º¸ÇÏ·Á´Â ¿òÁ÷ÀÓÀ» °¡¼ÓÈ­Çϰí ÀÖ½À´Ï´Ù. °í¼º´É ÄÄÇ»ÆÃ(HPC)¿¡ ´ëÇÑ ¼³ºñ ÅõÀÚ Áõ°¡´Â GAAFET ¼öÁØÀÇ ¼º´ÉÀ» ´ë±Ô¸ð·Î ¿ä±¸Çϰí ÀÖ½À´Ï´Ù. ºñ¿ë, Àü·Â ¼Òºñ, ¼º´ÉÀÌ °è¼ÓÇØ¼­ ¼³°è °í·Á»çÇ×À» Áö¹èÇÏ´Â °¡¿îµ¥, GAAFET ±â¼úÀº ÷´Ü ³ëµå ¹ÝµµÃ¼ÀÇ °áÁ¤ÀûÀÎ ¾ÆÅ°ÅØÃ³°¡ µÇ¾î ¾÷°è¸¦ Çõ½Å°ú ½ÃÀå ¼ºÀåÀÇ »õ·Î¿î ´Ü°è·Î À̲ø °ÍÀÔ´Ï´Ù.

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Global GAAFET Technology Market to Reach US$327.5 Million by 2030

The global market for GAAFET Technology estimated at US$73.0 Million in the year 2024, is expected to reach US$327.5 Million by 2030, growing at a CAGR of 28.4% over the analysis period 2024-2030. Nano Wires, one of the segments analyzed in the report, is expected to record a 27.6% CAGR and reach US$118.3 Million by the end of the analysis period. Growth in the Nano Sheets segment is estimated at 30.6% CAGR over the analysis period.

The U.S. Market is Estimated at US$19.2 Million While China is Forecast to Grow at 27.0% CAGR

The GAAFET Technology market in the U.S. is estimated at US$19.2 Million in the year 2024. China, the world's second largest economy, is forecast to reach a projected market size of US$49.6 Million by the year 2030 trailing a CAGR of 27.0% over the analysis period 2024-2030. Among the other noteworthy geographic markets are Japan and Canada, each forecast to grow at a CAGR of 25.8% and 24.7% respectively over the analysis period. Within Europe, Germany is forecast to grow at approximately 19.8% CAGR.

Global GAAFET Technology Market - Key Trends & Drivers Summarized

Why Is GAAFET Technology Heralding a New Era in Semiconductor Innovation?

Gate-All-Around Field-Effect Transistor (GAAFET) technology represents a transformative advancement in semiconductor architecture, marking a critical evolution from FinFET (Fin Field-Effect Transistor) structures to a more scalable, power-efficient, and performance-optimized transistor design. As semiconductor nodes shrink beyond 5nm into the 3nm and 2nm territory, traditional FinFET designs face significant limitations in controlling short-channel effects, leakage currents, and electrostatic integrity. GAAFET overcomes these challenges by completely surrounding the transistor channel with the gate, allowing for superior control over current flow and enabling tighter switching characteristics. This enhanced electrostatic control results in significantly reduced power consumption and improved drive current, making GAAFETs ideal for high-performance, low-power applications in advanced computing, mobile processors, and artificial intelligence (AI) workloads. Unlike FinFETs, GAAFET structures-such as nanosheets or nanowires-can be precisely tuned for different performance targets by varying the width of the channel, a flexibility that empowers foundries to offer multiple performance-power tradeoffs within a single process node. Leading semiconductor manufacturers like Samsung, Intel, and TSMC are aggressively investing in GAAFET development and integration into their next-generation chip designs. As Moore’s Law slows and transistor scaling becomes more complex, GAAFET technology is emerging as a cornerstone of future chip performance, enabling continued innovation in an increasingly data-driven world.

How Are End-Use Applications Driving Adoption and Customization of GAAFET Technology?

The adoption of GAAFET technology is being rapidly accelerated by its applicability across a wide spectrum of performance-critical and power-sensitive end-use applications. In the consumer electronics sector, next-generation smartphones, laptops, and wearables require chipsets that can deliver high-speed computing while conserving battery life-objectives that GAAFETs address with their superior power efficiency and thermal behavior. For AI and machine learning (ML) workloads, which demand vast parallel processing and fast data throughput, GAAFET-based logic enables higher transistor density and lower latency, critical for real-time inferencing and training models. In data centers, where performance per watt is a key metric, GAAFETs offer the energy savings necessary to sustain growth in cloud computing without proportionally increasing operational costs or carbon footprint. Automotive electronics, particularly in autonomous vehicles and advanced driver-assistance systems (ADAS), are also benefitting from the reliability and high-frequency operation of GAAFETs, which support complex onboard decision-making systems. Additionally, in the Internet of Things (IoT) and edge computing environments, where devices must balance minimal energy consumption with computational agility, GAAFETs allow for ultra-compact, high-efficiency SoCs (systems on chips). As applications grow more diverse and demanding, GAAFETs provide the scalability and configurability needed to serve multiple performance tiers-from ultra-low power sensors to high-end processors-ushering in a new era of device intelligence and integration.

What Technological Innovations Are Powering the Development and Integration of GAAFET Architectures?

The implementation of GAAFET technology is being propelled by a wave of innovations in materials engineering, lithography, and device fabrication techniques, all of which are essential for overcoming the challenges of nanoscale transistor design. One of the defining features of GAAFETs is their use of stacked nanosheets or nanowires, which require atomic-level precision during the deposition and etching processes. Advanced extreme ultraviolet (EUV) lithography plays a pivotal role in patterning these structures with sub-nanometer accuracy, enabling manufacturers to achieve high yields even at nodes below 3nm. Atomic layer deposition (ALD) and selective etching techniques are also critical in forming the ultra-thin channels and conformal gate structures that define GAAFET performance. Materials such as high-k dielectrics, silicon-germanium (SiGe), and new metal gate stacks are being optimized to enhance mobility, reduce parasitic capacitance, and maintain reliability over extended use. 3D integration techniques, including chiplet architectures and through-silicon vias (TSVs), are being co-developed to complement GAAFET-based designs in system-level packages. Furthermore, computational modeling, AI-assisted design automation, and electronic design automation (EDA) tools are enabling precise simulation and layout of GAAFET transistors under varied electrical and thermal conditions. Research into new channel materials, including III-V semiconductors and 2D materials like graphene and MoS2, hints at the future expansion of GAAFET capabilities. These technology enablers are ensuring that GAAFETs are not only viable at sub-3nm nodes but also poised for long-term evolution well into the angstrom era of chipmaking.

What Market Dynamics Are Driving the Global Adoption of GAAFET Technology?

The growth of the GAAFET technology market is being fueled by a confluence of market pressures, geopolitical shifts, industry roadmaps, and competitive dynamics that collectively favor the transition from FinFETs to more advanced transistor architectures. One of the foremost drivers is the semiconductor industry’s need to continue performance scaling in the post-Moore’s Law era, where gains in transistor count and power efficiency are harder to achieve through conventional means. GAAFET’s superior scalability and energy efficiency align perfectly with this goal, making it the next logical step in silicon evolution. As chipmakers face increasing pressure to deliver smaller, faster, and more power-conscious chips, GAAFET offers a timely solution that meets the demands of leading-edge nodes. Meanwhile, the global push for technological sovereignty-exacerbated by supply chain disruptions and geopolitical tensions-is prompting nations and corporations to invest heavily in domestic semiconductor R&D and foundry capabilities, with GAAFET often positioned at the heart of these next-generation fabs. Competitive rivalry among semiconductor giants like Intel, Samsung, and TSMC is also driving accelerated adoption, with each aiming to gain a technological edge by bringing commercial GAAFET-based chips to market first. Rising capital investment in AI, quantum computing, 5G infrastructure, and high-performance computing (HPC) is amplifying the need for GAAFET-level performance at scale. As cost, power, and performance continue to dominate design considerations, GAAFET technology is set to become the defining architecture of advanced node semiconductors, guiding the industry into a new phase of innovation and market growth.

SCOPE OF STUDY:

The report analyzes the GAAFET Technology market in terms of units by the following Segments, and Geographic Regions/Countries:

Segments:

Type (Nano Wires, Nano Sheets, Hexagonal FETs, Nano-Ring FETs, Nanoslab FETs); End-Use (Energy & Power, Consumer Electronics, Industrial Systems, Automotive, Other End-Uses)

Geographic Regions/Countries:

World; United States; Canada; Japan; China; Europe (France; Germany; Italy; United Kingdom; and Rest of Europe); Asia-Pacific; Rest of World.

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TABLE OF CONTENTS

I. METHODOLOGY

II. EXECUTIVE SUMMARY

III. MARKET ANALYSIS

IV. COMPETITION

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