Global Burn-In Test System for Semiconductor market size in terms of revenue is projected to reach 1,276.17 million USD by 2031 from 800.76 million USD in 2024, with a CAGR 7.10% during 2025-2031. Global Burn-In Test System for Semiconductor market size in terms of sales is projected to reach 6,148 Units by 2031 from 4,140 Units in 2024, with a CAGR 6.49% during 2025-2031.
North America market for Burn-In Test System for Semiconductor is estimated to increase from 132.67 million USD in 2024 to reach 196.45 million USD by 2031, at a CAGR of 10.64% during the forecast period of 2025 through 2031.
Europe market for Burn-In Test System for Semiconductor is estimated to increase from 93.31 million USD in 2024 to reach 134.40 million USD by 2031, at a CAGR of 5.44% during the forecast period of 2025 through 2031.
Asia-Pacific market for Burn-In Test System for Semiconductor is estimated to increase from 558.56 million USD in 2024 to reach 919.41 million USD by 2031, at a CAGR of 6.69% during the forecast period of 2025 through 2031.
The major global manufacturers of Burn-In Test System for Semiconductor include DI Corporation, Advantest, Micro Control Company, STK Technology, KES Systems, ESPEC, Aehr Test Systems, Zhejiang Hangke Instrument, STAr Technologies (Innotech), Chroma, etc. In 2024, the world's top five vendors accounted for approximately 44.39% of the revenue.
Report Scope
This report aims to provide a comprehensive presentation of the global market for Burn-In Test System for Semiconductor, with both quantitative and qualitative analysis, to help readers develop business/growth strategies, assess the market competitive situation, analyze their position in the current marketplace, and make informed business decisions regarding Burn-In Test System for Semiconductor.
The Burn-In Test System for Semiconductor market size, estimations, and forecasts are provided in terms of output/shipments (Units) and revenue ($ millions), considering 2024 as the base year, with history and forecast data for the period from 2020 to 2031. This report segments the global Burn-In Test System for Semiconductor market comprehensively. Regional market sizes, concerning products by Type, by Application, and by players, are also provided.
For a more in-depth understanding of the market, the report provides profiles of the competitive landscape, key competitors, and their respective market ranks. The report also discusses technological trends and new product developments.
The report will help the Burn-In Test System for Semiconductor manufacturers, new entrants, and industry chain related companies in this market with information on the revenues, production, and average price for the overall market and the sub-segments across the different segments, by company, by Type, by Application, and by regions.
Market Segmentation
By Company
DI Corporation
Advantest
Micro Control Company
STK Technology
KES Systems
ESPEC
Aehr Test Systems
Zhejiang Hangke Instrument
STAr Technologies (Innotech)
Chroma
EDA Industries
Hangzhou Changchuan Technology
Trio-Tech International
Wuhan Eternal Technologies
Wuhan Jingce Electronic
Shenzhen Kingcable
Wuhan Precise Electronic
Electron Test Equipment
Guangzhou Sairui
FitTech
Segment by Type
Static Testing
Dynamic Testing
Segment by Application
Integrated Circuit
Discrete Device
Sensor
Optoelectronic Device
Production by Region
North America
Europe
China
Japan
South Korea
Taiwan
Consumption by Region
North America
U.S.
Canada
Asia-Pacific
China
Japan
South Korea
Taiwan
Southeast Asia
India
Europe
Germany
France
U.K.
Italy
Russia
Rest of Europe
Latin America, Middle East & Africa
Mexico
Brazil
Israel
Chapter Outline:
Chapter 1: Introduces the report scope of the report, executive summary of different market segments (by region, by Type, by Application, etc), including the market size of each market segment, future development potential, and so on. It offers a high-level view of the current state of the market and its likely evolution in the short to mid-term, and long term.
Chapter 2: Detailed analysis of Burn-In Test System for Semiconductor manufacturers competitive landscape, price, production and value market share, latest development plan, merger, and acquisition information, etc.
Chapter 3: Production/output, value of Burn-In Test System for Semiconductor by region/country. It provides a quantitative analysis of the market size and development potential of each region in the next six years.
Chapter 4: Consumption of Burn-In Test System for Semiconductor in regional level and country level. It provides a quantitative analysis of the market size and development potential of each region and its main countries and introduces the market development, future development prospects, market space, and production of each country in the world.
Chapter 5: Provides the analysis of various market segments by Type, covering the market size and development potential of each market segment, to help readers find the blue ocean market in different market segments.
Chapter 6: Provides the analysis of various market segments by Application, covering the market size and development potential of each market segment, to help readers find the blue ocean market in different downstream markets.
Chapter 7: Provides profiles of key players, introducing the basic situation of the main companies in the market in detail, including product production/output, value, price, gross margin, product introduction, recent development, etc.
Chapter 8: Analysis of industrial chain, including the upstream and downstream of the industry.
Chapter 9: Introduces the market dynamics, latest developments of the market, the driving factors and restrictive factors of the market, the challenges and risks faced by manufacturers in the industry, and the analysis of relevant policies in the industry.
Chapter 10: The main points and conclusions of the report.
Table of Contents
1 Burn-In Test System for Semiconductor Market Overview
1.1 Product Definition
1.2 Burn-In Test System for Semiconductor by Type
1.2.1 Global Burn-In Test System for Semiconductor Market Value Growth Rate Analysis by Type: 2024 VS 2031
1.2.2 Static Testing
1.2.3 Dynamic Testing
1.3 Burn-In Test System for Semiconductor by Application
1.3.1 Global Burn-In Test System for Semiconductor Market Value Growth Rate Analysis by Application: 2024 VS 2031
1.3.2 Integrated Circuit
1.3.3 Discrete Device
1.3.4 Sensor
1.3.5 Optoelectronic Device
1.4 Global Market Growth Prospects
1.4.1 Global Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
1.4.2 Global Burn-In Test System for Semiconductor Production Capacity Estimates and Forecasts (2020-2031)
1.4.3 Global Burn-In Test System for Semiconductor Production Estimates and Forecasts (2020-2031)
1.4.4 Global Burn-In Test System for Semiconductor Market Average Price Estimates and Forecasts (2020-2031)
1.5 Assumptions and Limitations
2 Market Competition by Manufacturers
2.1 Global Burn-In Test System for Semiconductor Production Market Share by Manufacturers (2020-2025)
2.2 Global Burn-In Test System for Semiconductor Production Value Market Share by Manufacturers (2020-2025)
2.3 Global Key Players of Burn-In Test System for Semiconductor, Industry Ranking, 2023 VS 2024
2.4 Global Burn-In Test System for Semiconductor Company Type and Market Share by Company Type (Tier 1, Tier 2, and Tier 3)
2.5 Global Burn-In Test System for Semiconductor Average Price by Manufacturers (2020-2025)
2.6 Global Key Manufacturers of Burn-In Test System for Semiconductor, Manufacturing Sites & Headquarters
2.7 Global Key Manufacturers of Burn-In Test System for Semiconductor, Product Type & Application
2.8 Global Key Manufacturers of Burn-In Test System for Semiconductor, Date of Enter into This Industry
2.9 Global Burn-In Test System for Semiconductor Market Competitive Situation and Trends
2.9.1 Global Burn-In Test System for Semiconductor Market Concentration Rate
2.9.2 Global 5 and 10 Largest Burn-In Test System for Semiconductor Players Market Share by Revenue
2.10 Mergers & Acquisitions, Expansion
3 Burn-In Test System for Semiconductor Production by Region
3.1 Global Burn-In Test System for Semiconductor Production Value Estimates and Forecasts by Region: 2020 VS 2024 VS 2031
3.2 Global Burn-In Test System for Semiconductor Production Value by Region (2020-2031)
3.2.1 Global Burn-In Test System for Semiconductor Production Value Market Share by Region (2020-2025)
3.2.2 Global Forecasted Production Value of Burn-In Test System for Semiconductor by Region (2026-2031)
3.3 Global Burn-In Test System for Semiconductor Production Estimates and Forecasts by Region: 2020 VS 2024 VS 2031
3.4 Global Burn-In Test System for Semiconductor Production by Region (2020-2031)
3.4.1 Global Burn-In Test System for Semiconductor Production Market Share by Region (2020-2025)
3.4.2 Global Forecasted Production of Burn-In Test System for Semiconductor by Region (2026-2031)
3.5 Global Burn-In Test System for Semiconductor Market Price Analysis by Region (2020-2025)
3.6 Global Burn-In Test System for Semiconductor Production and Value, Year-over-Year Growth
3.6.1 North America Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
3.6.2 Europe Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
3.6.3 China Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
3.6.4 Japan Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
3.6.5 South Korea Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
3.6.6 Taiwan Burn-In Test System for Semiconductor Production Value Estimates and Forecasts (2020-2031)
4 Burn-In Test System for Semiconductor Consumption by Region
4.1 Global Burn-In Test System for Semiconductor Consumption Estimates and Forecasts by Region: 2020 VS 2024 VS 2031
4.2 Global Burn-In Test System for Semiconductor Consumption by Region (2020-2031)
4.2.1 Global Burn-In Test System for Semiconductor Consumption by Region (2020-2031)
4.2.2 Global Burn-In Test System for Semiconductor Forecasted Consumption by Region (2026-2031)
4.3 North America
4.3.1 North America Burn-In Test System for Semiconductor Consumption Growth Rate by Country: 2020 VS 2024 VS 2031
4.3.2 North America Burn-In Test System for Semiconductor Consumption by Country (2020-2031)
4.3.3 U.S.
4.3.4 Canada
4.4 Europe
4.4.1 Europe Burn-In Test System for Semiconductor Consumption Growth Rate by Country: 2020 VS 2024 VS 2031
4.4.2 Europe Burn-In Test System for Semiconductor Consumption by Country (2020-2031)
4.4.3 Germany
4.4.4 France
4.4.5 U.K.
4.4.6 Italy
4.4.7 Russia
4.5 Asia Pacific
4.5.1 Asia Pacific Burn-In Test System for Semiconductor Consumption Growth Rate by Country: 2020 VS 2024 VS 2031
4.5.2 Asia Pacific Burn-In Test System for Semiconductor Consumption by Region (2020-2031)
4.5.3 China
4.5.4 Japan
4.5.5 South Korea
4.5.6 Taiwan
4.5.7 Southeast Asia
4.5.8 India
4.6 Latin America
4.6.1 Latin America Burn-In Test System for Semiconductor Consumption Growth Rate by Country: 2020 VS 2024 VS 2031
4.6.2 Latin America Burn-In Test System for Semiconductor Consumption by Country (2020-2031)
4.6.3 Mexico
4.6.4 Brazil
4.7 Middle East and Africa
4.7.1 Middle East and Africa Burn-In Test System for Semiconductor Consumption Growth Rate by Country: 2020 VS 2024 VS 2031
4.7.2 Middle East and Africa Burn-In Test System for Semiconductor Consumption by Country (2020-2031)
4.7.3 Israel
5 Segment by Type
5.1 Global Burn-In Test System for Semiconductor Production by Type (2020-2031)
5.1.1 Global Burn-In Test System for Semiconductor Production by Type (2020-2025)
5.1.2 Global Burn-In Test System for Semiconductor Production by Type (2026-2031)
5.1.3 Global Burn-In Test System for Semiconductor Production Market Share by Type (2020-2031)
5.2 Global Burn-In Test System for Semiconductor Production Value by Type (2020-2031)
5.2.1 Global Burn-In Test System for Semiconductor Production Value by Type (2020-2025)
5.2.2 Global Burn-In Test System for Semiconductor Production Value by Type (2026-2031)
5.2.3 Global Burn-In Test System for Semiconductor Production Value Market Share by Type (2020-2031)
5.3 Global Burn-In Test System for Semiconductor Price by Type (2020-2031)
6 Segment by Application
6.1 Global Burn-In Test System for Semiconductor Production by Application (2020-2031)
6.1.1 Global Burn-In Test System for Semiconductor Production by Application (2020-2025)
6.1.2 Global Burn-In Test System for Semiconductor Production by Application (2026-2031)
6.1.3 Global Burn-In Test System for Semiconductor Production Market Share by Application (2020-2031)
6.2 Global Burn-In Test System for Semiconductor Production Value by Application (2020-2031)
6.2.1 Global Burn-In Test System for Semiconductor Production Value by Application (2020-2025)
6.2.2 Global Burn-In Test System for Semiconductor Production Value by Application (2026-2031)
6.2.3 Global Burn-In Test System for Semiconductor Production Value Market Share by Application (2020-2031)
6.3 Global Burn-In Test System for Semiconductor Price by Application (2020-2031)
7 Key Companies Profiled
7.1 DI Corporation
7.1.1 DI Corporation Burn-In Test System for Semiconductor Company Information
7.1.2 DI Corporation Burn-In Test System for Semiconductor Product Portfolio
7.1.3 DI Corporation Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.1.4 DI Corporation Main Business and Markets Served
7.1.5 DI Corporation Recent Developments/Updates
7.2 Advantest
7.2.1 Advantest Burn-In Test System for Semiconductor Company Information
7.2.2 Advantest Burn-In Test System for Semiconductor Product Portfolio
7.2.3 Advantest Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.2.4 Advantest Main Business and Markets Served
7.2.5 Advantest Recent Developments/Updates
7.3 Micro Control Company
7.3.1 Micro Control Company Burn-In Test System for Semiconductor Company Information
7.3.2 Micro Control Company Burn-In Test System for Semiconductor Product Portfolio
7.3.3 Micro Control Company Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.3.4 Micro Control Company Main Business and Markets Served
7.3.5 Micro Control Company Recent Developments/Updates
7.4 STK Technology
7.4.1 STK Technology Burn-In Test System for Semiconductor Company Information
7.4.2 STK Technology Burn-In Test System for Semiconductor Product Portfolio
7.4.3 STK Technology Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.4.4 STK Technology Main Business and Markets Served
7.4.5 STK Technology Recent Developments/Updates
7.5 KES Systems
7.5.1 KES Systems Burn-In Test System for Semiconductor Company Information
7.5.2 KES Systems Burn-In Test System for Semiconductor Product Portfolio
7.5.3 KES Systems Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.5.4 KES Systems Main Business and Markets Served
7.5.5 KES Systems Recent Developments/Updates
7.6 ESPEC
7.6.1 ESPEC Burn-In Test System for Semiconductor Company Information
7.6.2 ESPEC Burn-In Test System for Semiconductor Product Portfolio
7.6.3 ESPEC Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.6.4 ESPEC Main Business and Markets Served
7.6.5 ESPEC Recent Developments/Updates
7.7 Aehr Test Systems
7.7.1 Aehr Test Systems Burn-In Test System for Semiconductor Company Information
7.7.2 Aehr Test Systems Burn-In Test System for Semiconductor Product Portfolio
7.7.3 Aehr Test Systems Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.7.4 Aehr Test Systems Main Business and Markets Served
7.7.5 Aehr Test Systems Recent Developments/Updates
7.8 Zhejiang Hangke Instrument
7.8.1 Zhejiang Hangke Instrument Burn-In Test System for Semiconductor Company Information
7.8.2 Zhejiang Hangke Instrument Burn-In Test System for Semiconductor Product Portfolio
7.8.3 Zhejiang Hangke Instrument Burn-In Test System for Semiconductor Production, Value, Price and Gross Margin (2020-2025)
7.8.4 Zhejiang Hangke Instrument Main Business and Markets Served